A procedure for assessing the reliability of short circuited concentration photovoltaic systems in outdoor degradation conditions

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Abstract

A procedure for assessing the reliability functions of photovoltaic concentration (CPV) systems, subjected to outdoor degradation, will be described in this work. The evaluation of the concentrator cells failure rate, the understanding of the origin of these degradation modes and how they affect the performances of concentration cells is an essential step to improve their reliability and to accelerate their competitiveness. The reliability evaluation methodology introduced here, as the cells are deployed outdoors and then are subjected to the actual sources of stress (e.g. ambient temperature, solar concentrated irradiance, cells working temperature and the variations of these parameters over days and seasons), will furnish values of failure rates very close to the true ones. © 2013 Elsevier Ltd. All rights reserved.
Original languageEnglish
Pages (from-to)182 - 187
Number of pages6
JournalMicroelectronics Reliability
Volume54
Issue number1
DOIs
Publication statusPublished - Jan 2014

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All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Surfaces, Coatings and Films
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Safety, Risk, Reliability and Quality

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