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Maria Luisa Grilli, Francesca Menchini, Angela Piegari, Daniele Alderighi, Guido Toci, Matteo Vannini

Research output: Contribution to journalArticle

21 Citations (Scopus)

Abstract

HfO2/SiO2 and Al2O3/SiO2 multilayers to be employed as high reflectance end mirrors in Cerium-doped fluoride solid-state lasers were produced by radio frequency sputtering. The components were designed to have high transmittance at the pumping wavelength and high reflectance in a wavelength band corresponding to the active medium emission. A photoacoustic beam deflection technique and inspection of the irradiated area under a microscope were used to measure the laser induced damage threshold of the mirrors at the pumping wavelength. These coatings were tested in a laser cavity. © 2008 Elsevier B.V. All rights reserved.
Original languageEnglish
Pages (from-to)1731 - 1735
Number of pages5
JournalThin Solid Films
Volume517
Issue number5
DOIs
Publication statusPublished - 1 Jan 2009

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

Cite this

Grilli, M. L., Menchini, F., Piegari, A., Alderighi, D., Toci, G., & Vannini, M. (2009). Al. Thin Solid Films, 517(5), 1731 - 1735. https://doi.org/10.1016/j.tsf.2008.09.047