An integrated data analysis tool for improving measurements on the MST RFP

L.M. Reusch, M.E. Galante, P. Franz, J.R. Johnson, M.B. McGarry, H.D. Stephens, D.J. Den Hartog

Research output: Contribution to journalArticle

4 Citations (Scopus)


Many plasma diagnostics contain complementary information. For example, the double-foil soft x-ray system (SXR) and the Thomson Scattering diagnostic (TS) on the Madison Symmetric Torus both measure electron temperature. The complementary information from these diagnostics can be combined using a systematic method based on integrated data analysis techniques, leading to more accurate and sensitive results. An integrated data analysis tool based on Bayesian probability theory was able to estimate electron temperatures that are consistent with both the SXR and TS diagnostics and more precise than either. A Markov Chain Monte Carlo analysis to increase the flexibility of the tool was implemented and benchmarked against a grid search method. © 2014 AIP Publishing LLC.
Original languageEnglish
Article number11D844
Pages (from-to)-
JournalReview of Scientific Instruments
Issue number11
Publication statusPublished - 2014
Externally publishedYes


All Science Journal Classification (ASJC) codes

  • Instrumentation

Cite this

Reusch, L. M., Galante, M. E., Franz, P., Johnson, J. R., McGarry, M. B., Stephens, H. D., & Den Hartog, D. J. (2014). An integrated data analysis tool for improving measurements on the MST RFP. Review of Scientific Instruments, 85(11), -. [11D844].