Analysis of the electronic structure of hydrogenated amorphous carbon via Auger spectroscopy

J.C. Lascovich, V. Rosato

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The X-ray excited Auger electron spectroscopy (XAES) has been used to investigate the pπ electronic structure of hydrogenated amorphous carbon (a-C:H) films, at different hydrogen content. The X-ray Photoelectron Spectra (XPS) of the C1s core level with the associated photoelectron energy loss spectrum (PELS) have been recorded simultaneously to the XAES data. It has been proved that the double-differentiated pπ*pπ Auger self-fold contribution to the CKVV Auger spectrum is very sensitive to the hydrogen content and/or sample preparation conditions, providing a reliable fingerprint of the material. The extent of the electronic gap and the fraction of sp2sites of the a-C:H films have been estimated. The features of the Auger pπ*pπ self-fold structure can be associated to those appearing in the electronic density of states evaluated using Molecular Dynamics simulations.
Original languageEnglish
Pages (from-to)10 - 18
Number of pages9
JournalApplied Surface Science
Issue number1
Publication statusPublished - 1 Nov 1999
Externally publishedYes


All Science Journal Classification (ASJC) codes

  • Surfaces, Coatings and Films

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