Analysis of the oxidation of polycrystalline zinc selenide by spectroscopic ellipsometry and photothermal deflection spectroscopy

E. Masetti, M. Montecchi, M.P. da Silva

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Abstract

The surface of polycrystalline zinc selenide was examined by spectroscopic ellipsometry (500-840 nm) and photothermal deflection spectroscopy (500-840 nm and 10.6 μm). Sample surfaces finished in different ways were considered. For each of them an overlayer was detected and its optical constants were characterized before and after UV exposure. The UV exposure caused a manifest growth of the overlayer and an increment in the absorption at 10.6 μm. Chemical analysis revealed the presence of selenium oxide in the overlayers. The ZnSe refractive index was determined in the 500-840 nm range. A cleaning procedure to obtain an almost contaminant-free surface was developed. © 1993.
Original languageEnglish
Pages (from-to)557 - 560
Number of pages4
JournalThin Solid Films
Volume234
Issue number1-2
DOIs
Publication statusPublished - 25 Oct 1993

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

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