Analysis of traps in high quality CVD diamond films through the temperature dependence of carrier dynamics

Marco Marinelli, E. Milani, A. Paoletti, G. Pucella, A. Tucciarone, G. Verona Rinati, M. Angelone, M. Pillon

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Abstract

The analysis of the time behavior of pulses generated by CVD diamond films irradiated with α-particles has been recently shown to be a general and powerful tool to investigate trap properties in diamond films (M. Marinelli et al., Phys. Rev. B 64 (2001) 195205). We use here this technique to measure the activation energy of traps in CVD diamond films, through the analysis of the temperature dependence of the dynamics of carriers generated by α-particle irradiation. The samples used in this study are high quality films deposited in a microwave tubular reactor and show very narrow diamond Raman peaks (FWHM approximately 2.4 cm-1) and extremely low photoluminescence background. The time evolution of the response of α-particle detectors built from these films exhibit both a fast and a slow component. Quantitative analysis leads to the conclusion that only deep traps limit the electron mean free path before trapping, while for holes both deep and shallow centers must be taken into account, the latter becoming the limiting factor in the pumped state. The changes in the pulse shapes are analyzed when the film temperature T is varied from -40 to 20 °C. A systematic speed-up of the response is found with increasing temperature, confirming that the slow component is due to thermally activated detrapping from the relative shallow defects. The detrapping time constant τDis connected to the activation energy EDof the defects through the formula 1 /τD=s exp(- ED/kT ), where s is the attempt frequency. Plotting ln( τD) vs. 1/T allows to determine the activation energy of the shallow defects, which is found to be 0.35 eV. © 2003 Elsevier Science B.V. All rights reserved.
Original languageEnglish
Pages (from-to)1733 - 1737
Number of pages5
JournalDiamond and Related Materials
Volume12
Issue number10-11
DOIs
Publication statusPublished - 2003
Externally publishedYes

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Chemistry(all)
  • Mechanical Engineering
  • Physics and Astronomy(all)
  • Materials Chemistry
  • Electrical and Electronic Engineering

Cite this

Marinelli, M., Milani, E., Paoletti, A., Pucella, G., Tucciarone, A., Verona Rinati, G., ... Pillon, M. (2003). Analysis of traps in high quality CVD diamond films through the temperature dependence of carrier dynamics. Diamond and Related Materials, 12(10-11), 1733 - 1737. https://doi.org/10.1016/S0925-9635(03)00204-8