Angle-resolved differential reflectance: Technique for 0°-90° incidence angle reflectance measurements

Antonio Parretta, Pasqualino Maddalena, Pierpasquale Tortora

Research output: Contribution to conferencePaper

Abstract

A new method is presented for measurements of angle-resolved reflectance of a plane surface. The main innovation introduced by the method consists in allowing to carry out reflectance measurements from 0° to 90° of incidence angle. This was obtained by changing the technique of sample illumination: instead of illuminating a portion of the test surface, the entire test surface is illuminated by a collimated and uniform beam at any angle of incidence. To be applied, the method requires, besides measurement on the unknown sample, also measurements on two different standards of diffuse reflectance. The method is particularly suitable for the optical characterization of photovoltaic devices, generally exposed to the inclined light of the direct component of solar radiation.
Original languageEnglish
DOIs
Publication statusPublished - 2003
Externally publishedYes
Event19th Congress of the International Commisssion for Optics Optics for the Quality of Life - , Italy
Duration: 1 Jan 2003 → …

Conference

Conference19th Congress of the International Commisssion for Optics Optics for the Quality of Life
CountryItaly
Period1/1/03 → …

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All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Parretta, A., Maddalena, P., & Tortora, P. (2003). Angle-resolved differential reflectance: Technique for 0°-90° incidence angle reflectance measurements. Paper presented at 19th Congress of the International Commisssion for Optics Optics for the Quality of Life, Italy. https://doi.org/10.1117/12.530968