Bayesian derivation of electron temperature profile using JET ECE diagnostics

S. Schmuck, J. Svensson, E. De La Luna, L. Figini, T. Johnson, B. Alper, M. Beurskens, J. Fessey, T. Gerbaud, A. Sirinelli

Research output: Contribution to conferencePaper

5 Citations (Scopus)
Original languageEnglish
Publication statusPublished - 2011
Externally publishedYes
Event38th EPS Conference on Plasma Physics 2011, EPS 2011 - , France
Duration: 1 Jan 2011 → …

Conference

Conference38th EPS Conference on Plasma Physics 2011, EPS 2011
CountryFrance
Period1/1/11 → …

All Science Journal Classification (ASJC) codes

  • Nuclear and High Energy Physics

Cite this

Schmuck, S., Svensson, J., De La Luna, E., Figini, L., Johnson, T., Alper, B., Beurskens, M., Fessey, J., Gerbaud, T., & Sirinelli, A. (2011). Bayesian derivation of electron temperature profile using JET ECE diagnostics. Paper presented at 38th EPS Conference on Plasma Physics 2011, EPS 2011, France.