For the first time, a confocal light scanning microscope (CLSM) in fluorescence mode was used to reconstruct the depth distribution of efficiently emitting laser-active color centers (CCs) in a stripe-like region induced by 12 keV electrons on lithium fluoride (LiF) films thermally evaporated on glass. The formation of the F3+and F2aggregate defects appears restricted to the electron penetration and proportional to their energy depth profile, as obtained from a Monte Carlo simulation.
|Pages (from-to)||764 - 770|
|Number of pages||7|
|Journal||Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms|
|Publication status||Published - 2 May 2000|
All Science Journal Classification (ASJC) codes
- Nuclear and High Energy Physics
Montereali, R. M., Bigotta, S., Piccinini, M., Giammatteo, M., Picozzi, P., & Santucci, S. (2000). Broad-band active channels induced by electron beam lithography in LiF films for waveguiding devices. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 166, 764 - 770. https://doi.org/10.1016/S0168-583X(99)01045-9