Characterization of chromium silicide thin layer formed on amorphous silicon films

D. Caputo, G. de Cesare, M. Ceccarelli, A. Nascetti, M. Tucci, L. Meda, M. Losurdo, G. Bruno

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Abstract

A detailed investigation of the compositional, optical and electrical properties of a chromium silicide layer grown at room temperature on top of doped amorphous silicon films is presented. The formation of the layer is promoted only when phosphorous atoms are present in the film. The deposition of a very thin n-type doped layer (around 5 nm) on top of a p-type doped film has allowed us to achieve the chromium silicide formation also on p-type material without changing its doping properties. Angle resolved X-ray photoelectron spectroscopy measurements demonstrate the presence of chromium-oxide, chromium silicide and metallic chromium in similar percentages for both p- and n-type doped layers. From the ellipsometric analysis, the refractive index spectra have been extracted, and the layer thickness has been estimated to be 5 nm for both p- and n-type doped layers. From planar conductivity measurements, we have found that the chromium silicide promotes an activation energy reduction from 0.24 eV down to 0.017 eV for the n-type layer and from 0.36 eV down to 0.14 eV for the p-type film. © 2007 Elsevier B.V. All rights reserved.
Original languageEnglish
Pages (from-to)2171 - 2175
Number of pages5
JournalJournal of Non-Crystalline Solids
Volume354
Issue number19-25
DOIs
Publication statusPublished - 1 May 2008
Externally publishedYes

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Condensed Matter Physics
  • Materials Chemistry

Cite this

Caputo, D., de Cesare, G., Ceccarelli, M., Nascetti, A., Tucci, M., Meda, L., Losurdo, M., & Bruno, G. (2008). Characterization of chromium silicide thin layer formed on amorphous silicon films. Journal of Non-Crystalline Solids, 354(19-25), 2171 - 2175. https://doi.org/10.1016/j.jnoncrysol.2007.10.040