Characterization of detection efficiency as function of energy for soft x-ray detectors

D. Pacella, D. Mazon, A. Romano, P. Malard, G. Pizzicaroli

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Abstract

A new technique has been especially developed for determining the detection efficiency of the silicon surface barrier diodes used for tomography reconstructions at Tore Supra, as function of the energy of the x-ray photons, in the range of 4-25 keV. The response of these diodes has been studied for different bias voltages (0-120 V), with a portable x-ray electronic tube and a cooled Si-p-i-n diode, working in photon counting mode, for the absolute calibration. © 2008 American Institute of Physics.
Original languageEnglish
Article number10E322
Pages (from-to)-
JournalReview of Scientific Instruments
Volume79
Issue number10
DOIs
Publication statusPublished - 2008
Externally publishedYes

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All Science Journal Classification (ASJC) codes

  • Instrumentation

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