Characterization of inhomogeneous optical interference films using a complex parabolic profile model

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The evaluation of the inhomogeneity of the complex refractive index n-ik throughout the thickness of a thin optical film is an important topic. In a previous work, regarding the n inhomogeneity, we found that the assumption of a model with a parabolic n profile throughout the film thickness allows us to characterize inhomogeneous films and to evaluate the n inhomogeneity even when the parabolic model is not realistic. Here the author completes the work by introducing a film model which also has a parabolic k profile and by describing a procedure for the unequivocal determination of the complex parabolic model parameters from normal incidence spectrophotometric measurements of T( lambda ), R( lambda ) and R'( lambda ).
Original languageEnglish
Article number012
Pages (from-to)831 - 839
Number of pages9
JournalPure and Applied Optics: Journal of the European Optical Society Part A
Issue number6
Publication statusPublished - 1995


All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Physics and Astronomy(all)

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