Characterization of nanostructured copper films for electromagnetic shield

Daniele Desideri, Alvise Maschio, Monica Spolaore

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

Purpose - The purpose of this paper is to obtain a multidisciplinary characterization of nanostructured copper films for electromagnetic shields. Design/methodology/approach - Structural and electrical analysis have been applied, on copper nanometric films produced by a magnetron sputtering device. Findings - Data are provided for copper films realized by magnetron sputtering deposition on glass, in different operating conditions. Practical implications - A multidisciplinary comprehension of shielding effectiveness of nanostructured thin films can be important in many applications where there are electromagnetic compatibility problems. Originality/value - The paper gives a valuable set of information for the characterization of nanometric copper thin films. © 2012 Emerald Group Publishing Limited.
Original languageEnglish
Pages (from-to)1122 - 1132
Number of pages11
JournalCOMPEL - The International Journal for Computation and Mathematics in Electrical and Electronic Engineering
Volume31
Issue number4
DOIs
Publication statusPublished - 2012
Externally publishedYes

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All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Computer Science Applications
  • Computational Theory and Mathematics
  • Applied Mathematics

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