Characterization of second and third order optical nonlinearities of ZnO sputtered films

M.C. Larciprete, D. Haertle, A. Belardini, M. Bertolotti, F. Sarto, P. Günter

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Abstract

We measured the second and third order optical nonlinearity of zinc oxide, grown on glass substrates by the ion beam sputtering technique. Second and third harmonic generation measurements were performed by means of the rotational Maker fringes technique for different polarization configurations, thus allowing the determination of all non-zero components of the second order susceptibility at three different fundamental beam wavelengths, i.e., 1064 nm, 1542 nm and 1907 nm. The dispersion of the nonlinear optical coefficients has been evaluated, while the nonlinear optical coefficients were found to range between 0.9 pm/V and 0.16 pm/V for d33, 0.53 pm/V and 0.08 pm/V for |d 15|, 0.31 and 0.08 pm/V for |d31|, with increasing wavelength. Finally, one third order susceptibility, χijkl(3), has been determined by third harmonic generation measurements at a fundamental wavelength λ=1907 nm and a value for χ3333(3) of 185×10-20 m2/V2 has been found.
Original languageEnglish
Pages (from-to)431 - 437
Number of pages7
JournalApplied Physics B: Lasers and Optics
Volume82
Issue number3
DOIs
Publication statusPublished - Mar 2006
Externally publishedYes

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All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)
  • Physics and Astronomy(all)

Cite this

Larciprete, M. C., Haertle, D., Belardini, A., Bertolotti, M., Sarto, F., & Günter, P. (2006). Characterization of second and third order optical nonlinearities of ZnO sputtered films. Applied Physics B: Lasers and Optics, 82(3), 431 - 437. https://doi.org/10.1007/s00340-005-2022-z