Charge fluctuations and concentration fluctuations at intermediate-range distances in the disordered network-forming materials SiO

Carlo Massobrio, Massimo Celino, Alfredo Pasquarello

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We calculate the concentration-concentration partial structure factor SCC(k) and the charge-charge structure factor Szz(k) of liquid SiO2, amorphous SiSe2and liquid GeSe2using first-principles molecular dynamics. These systems are characterized by the occurrence of intermediate range order, as evidenced by a first sharp diffraction peak (FSDP) at low k values in the total neutron structure factor. We show that a FSDP in the concentration-concentration partial structure factor SCC(k) is generally associated with a small departure from chemical order. This feature tends to vanish either when sufficiently high levels of structural disorder set in, or, oppositely, when the chemical order is essentially perfect. For none of these networks, a FSDP is observed in the charge-charge structure factor Szz(k), i.e., fluctuations of charge do not occur over intermediate range distances. The constraint of charge neutrality is at the very origin of the appearance of fluctuations of concentration. These are observed when the atoms occur in configurations with different coordinations.
Original languageEnglish
Article number174202
Pages (from-to)1 - 6
Number of pages6
JournalPhysical Review B - Condensed Matter and Materials Physics
Issue number17
Publication statusPublished - Nov 2004


All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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