Concentration of F

F. Bonfigli, B. Jacquier, R.M. Montereali, P. Moretti, V. Mussi, E. Nichelatti, F. Somma

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

Lithium fluoride (LiF) crystals and films treated with ionizing radiation are promising materials to realize light emitting devices in the visible spectral range. We studied the ion dose dependence of the concentration of F2and F3+active defects, both absorbing at about 450 nm and separately emitting in the visible range, in He+implanted LiF crystals. Quantitative information was deduced from transmission measurements by using a specially developed theoretical model to fit them, and was compared with the results obtained from photoluminescence spectra. Their qualitative agreement confirms the validity of our theoretical approach, which provides a simple and versatile tool of investigation of these peculiar active defects. © 2003 Elsevier B.V. All rights reserved.
Original languageEnglish
Pages (from-to)291 - 296
Number of pages6
JournalOptical Materials
Volume24
Issue number1-2
DOIs
Publication statusPublished - Oct 2003
Externally publishedYes

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Computer Science(all)
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

Cite this

Bonfigli, F., Jacquier, B., Montereali, R. M., Moretti, P., Mussi, V., Nichelatti, E., & Somma, F. (2003). Concentration of F. Optical Materials, 24(1-2), 291 - 296. https://doi.org/10.1016/S0925-3467(03)00137-X