Confocal laser scanning microscopy of active color centers based strips induced on LiF by low energy electron beams

S. Almaviva, G. Baldacchini, M. Piccinini, R.M. Montereali

Research output: Contribution to journalArticle

2 Citations (Scopus)


A confocal laser scanning microscope has been used in a non-conventional approach to reconstruct the depth distribution of stable, optically active color centers induced at the surface of a lithium fluoride crystal by a low energy electron beam. The formation of F2and F3+aggregate electronic defects was limited to the penetration depth of the electrons in the material, as obtained from Monte Carlo simulations. This novel measurement technique could be easily used for spatial characterization of luminescent optical waveguides in transparent dielectrics. © 2007 Elsevier B.V. All rights reserved.
Original languageEnglish
Pages (from-to)687 - 691
Number of pages5
JournalJournal of Non-Crystalline Solids
Issue number5-7
Publication statusPublished - 1 Apr 2007
Externally publishedYes


All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Condensed Matter Physics
  • Materials Chemistry

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