Correlated Disorder in YBCO and Composite YBCO Films Revealed by Means of Synchrotron X-Ray Diffraction

Andrea Augieri, Francesco Rizzo, Valentina Galluzzi, Antonella Mancini, Fabio Fabbri, Achille Angrisani Armenio, Angelo Vannozzi, Valentina Pinto, Alessandro Rufoloni, Laura Piperno, Andrea Masi, Giuseppe Celentano, Luisa Barba, Gianmichele Arrighetti, Gaetano Campi

Research output: Contribution to journalArticle

Abstract

The presence of lattice correlated disorder in real materials places further demands on the understanding of the structure-function relationship. The study of this disorder is quite challenging, since it can be due to various and interconnected reasons. This requires advanced probes able to measure weak structural features. Thanks to synchrotron radiation features, nowadays, it is possible to visualize structural disorder alongside its spatial distribution and time dynamics. In this context, we aim to characterize thin-film superconducting YBa2Cu3O7-x, whose structure is particularly rich. Indeed, here, the nanogranularity related to superlattices, distribution of dopants, and strain-induced stoichiometry inhomogeneity are coupled with the intrinsic granularity arising from the material island growth mode, which leads to small grains (∼200 nm) and a large network of grain boundaries. X-ray Grazing incidence diffraction has been used to visualize low-dimensional lattice disorder in optimally doped YBa2Cu3O7-xwith inclusion of BaZrO3nanodefects grown on SrTiO3single crystals. The results are expected to shade light on interplay of lattice disorder and the electronic quantum coherence in the superconducting state.
Original languageEnglish
Article number7500604
Pages (from-to)-
JournalIEEE Transactions on Applied Superconductivity
Volume28
Issue number4
DOIs
Publication statusPublished - 1 Jun 2018
Externally publishedYes

    Fingerprint

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Cite this