Current profile reconstruction using electron temperature imaging diagnostics

K. Tritz, D. Stutman, L.F. Delgado-Aparicio, M. Finkenthal, D. Pacella, R. Kaita, B. Stratton, S. Sabbagh

Research output: Contribution to journalArticle

Abstract

Flux surface shape information can be used to constrain the current profile for reconstruction of the plasma equilibrium. One method of inferring flux surface shape relies on plasma x-ray emission; however, deviations from the flux surfaces due to impurity and density asymmetries complicate the interpretation. Electron isotherm surfaces should correspond well to the plasma flux surfaces, and equilibrium constraint modeling using this isotherm information constrains the current profile. The KFIT code is used to assess the profile uncertainty and to optimize the number, location and SNR required for the Te detectors. As Te imaging detectors we consider tangentially viewing, vertically spaced, linear gas electron multiplier arrays operated in pulse height analysis (PHA) mode and multifoil soft x-ray arrays. Isoflux coordinate sets provided by Temeasurements offer a strong constraint on the equilibrium reconstruction in both a stacked horizontal array configuration and a crossed horizontal and vertical beam system with q0determined to within ±4%. The required SNR can be provided with either PHA or multicolor diagnostic techniques, though the multicolor system requires. ∼ × 4 better statistics for comparable final errors. © 2004 American Institute of Physics.
Original languageEnglish
Pages (from-to)4033 - 4036
Number of pages4
JournalReview of Scientific Instruments
Volume75
Issue number10 II
DOIs
Publication statusPublished - Oct 2004
Externally publishedYes

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All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Physics and Astronomy (miscellaneous)

Cite this

Tritz, K., Stutman, D., Delgado-Aparicio, L. F., Finkenthal, M., Pacella, D., Kaita, R., ... Sabbagh, S. (2004). Current profile reconstruction using electron temperature imaging diagnostics. Review of Scientific Instruments, 75(10 II), 4033 - 4036. https://doi.org/10.1063/1.1790056