Determination of Mg concentration and distribution in Mg

E.P. Ferlito, R. Ricciari, M. Padalino, S. Grasso, A. Battaglia, M. Sciuto, D. Mello, L. Tapfer, C. Gerardi

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Abstract

Among the transparent conductor, one of themost interesting is the Al doped MgxZn1-xO films for their electrical properties that make it very attracting for solar cell application. In thiswork, the Mg distribution in Al doped MgxZn1-xO films was investigated in order to find a reliable methods to determine Mg distribution. In particular, X-ray diffraction, Auger electron spectroscopy and time of flight secondary ion mass spectrometry were used to characterize the film. Time of flight secondary ion mass spectrometry MCs+results appear to be the most promising analytical technique.
Original languageEnglish
Pages (from-to)823 - 826
Number of pages4
JournalSurface and Interface Analysis
Volume46
Issue number10-11
DOIs
Publication statusPublished - 1 Oct 2014
Externally publishedYes

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All Science Journal Classification (ASJC) codes

  • Chemistry(all)
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

Cite this

Ferlito, E. P., Ricciari, R., Padalino, M., Grasso, S., Battaglia, A., Sciuto, M., ... Gerardi, C. (2014). Determination of Mg concentration and distribution in Mg. Surface and Interface Analysis, 46(10-11), 823 - 826. https://doi.org/10.1002/sia.5485