A general method for the determination of the resistivity tensor from multiterminal measurements is developed, based on the solution of a Laplace equation for the potential inside the sample with suitable boundary conditions. We have performed the calculation in the general case of an arbitrary contact geometry, with finite width of the contacts on the sample surfaces. The precision and the accuracy of the calculation and of the hypothesis of the model have been checked by means of a self-consistent method based on the reconstruction of voltage measurements. © 2000, American Institute of Physics. All rights reserved.
All Science Journal Classification (ASJC) codes
- Physics and Astronomy(all)
Esposito, M., Muzzi, L., Sarti, S., Fastampa, R., & Silva, E. (2000). Determination of the resistivity components [formula omitted] and [formula omitted] from multiterminal measurements in [formula omitted] crystals. Journal of Applied Physics, 88(5), 2724 - 2729. https://doi.org/10.1063/1.1286077