Effect of grain size and distribution on the shielding effectiveness of transparent conducting thin films

Domenico Alessandro Lampasi, Alessio Tamburrano, Stefania Bellini, Mario Tului, Augusto Albolino, Maria Sabrina Sarto

Research output: Contribution to journalArticle

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Abstract

This paper presents a morphological and functional characterization of nanostructured thin films featuring high radio frequency shielding effectiveness and high optical transparency in the wavelength range 400-1500 nm. The film morphology is analyzed at the micro- and nanoscales by processing the images acquired by a scanning electron microscope. A software tool developed for this purpose analyzes the statistical distributions of the film surface grains. Fitting models and experimental evidences are presented in order to describe and predict the correlations between the film morphological and functional properties. The adopted approach and measurement methods are developed to model and optimize a particular transparent conducting oxide but can be easily extended to similar materials, deposition processes, and applications. © 1964-2012 IEEE.
Original languageEnglish
Article number6642087
Pages (from-to)352 - 359
Number of pages8
JournalIEEE Transactions on Electromagnetic Compatibility
Volume56
Issue number2
DOIs
Publication statusPublished - 2014
Externally publishedYes

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All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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