Electron temperature diagnostics in the RFX reversed field pinch experiment

R. Bartiromo, L. Carraro, P. Franz, L. Marrelli, P. Martin, A. Murari, R. Pasqualotto, M.E. Puiatti, P. Scarin, M. Valisa, L. Zabeo

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Abstract

The paper presents an integrated approach to the problem of electron temperature diagnostics of the plasma in a reversed field pinch. Three different method, sampling different portions of the electron distribution function, are adopted, namely Thomson scattering, soft X-ray spectroscopy by pulse-height analysis and filtered soft X-ray intensity ratio. A careful analysis of the different sources of systematic errors is performed and a novel statistical approach is adopted to mutually validate the three independent measurements. A satisfactory agreement is obtained over a large range of experimental conditions, indicating that in the plasma core the energy distribution function is well represented by a maxwellian.
Original languageEnglish
Pages (from-to)881 - 892
Number of pages12
JournalPlasma Physics and Controlled Fusion
Volume42
Issue number8
DOIs
Publication statusPublished - Aug 2000
Externally publishedYes

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All Science Journal Classification (ASJC) codes

  • Nuclear Energy and Engineering
  • Condensed Matter Physics

Cite this

Bartiromo, R., Carraro, L., Franz, P., Marrelli, L., Martin, P., Murari, A., ... Zabeo, L. (2000). Electron temperature diagnostics in the RFX reversed field pinch experiment. Plasma Physics and Controlled Fusion, 42(8), 881 - 892. https://doi.org/10.1088/0741-3335/42/8/302