Electronic characterization of the single-wall carbon nanotubes: A XANES study

Z.Y. Wu, I. Davoli, M.L. Terranova, S. Orlanducci, V. Sessa, M. Abbas, K. Ibrahim, J. Zhong, S. Botti

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Abstract

The electronic structure of two different samples of single wall carbon nanotubes (SWCNs) have been investigated using x-ray absorption near edge spectroscopy (XANES). The XANES data, detected around the C K edge, have been compared with that of a pure HOPG sample used as structural standard. The measurements have been carried out at the photoemission 4B9B beamline (Synchrotron Radiation Facility of the Institute of High Energy Physics of Beijing) using a surface-sensitive total electron yield technique. The samples were previously characterized using Raman spectroscopy, electron microscopy (SEM), and tunneling microscopy (STM). The bonding properties of C atoms (π* and σ* bands of sp2-coordination) and the structural characteristics are identified by looking at the changes in both pre-edge and multiple-scattering regions of the XANES spectra. © Physica Scripta 2005.
Original languageEnglish
Pages (from-to)717 - 720
Number of pages4
JournalPhysica Scripta
VolumeT115
DOIs
Publication statusPublished - 2005
Externally publishedYes

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All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics
  • Mathematical Physics
  • Condensed Matter Physics

Cite this

Wu, Z. Y., Davoli, I., Terranova, M. L., Orlanducci, S., Sessa, V., Abbas, M., ... Botti, S. (2005). Electronic characterization of the single-wall carbon nanotubes: A XANES study. Physica Scripta, T115, 717 - 720. https://doi.org/10.1238/Physica.Topical.115a00717