Ellipsometric modeling of ultrathin silver-silica heterostructures

D. Zola, M. Giambra, M.L. Grilli, M. Fang, A. Sytchkova

Research output: Contribution to conferencePaper

Abstract

R.F. sputtered ultrathin silver-silica heterostructures were studied by variable-angle spectroscopic ellipsometry and by its analogue working in total reflection mode. The last one enables an enhanced sensitivity to the interface plasmonic properties. © OSA 2013.
Original languageEnglish
Publication statusPublished - 2013
EventOptical Interference Coatings, OIC 2013 - , Canada
Duration: 1 Jan 2013 → …

Conference

ConferenceOptical Interference Coatings, OIC 2013
CountryCanada
Period1/1/13 → …

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All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

Cite this

Zola, D., Giambra, M., Grilli, M. L., Fang, M., & Sytchkova, A. (2013). Ellipsometric modeling of ultrathin silver-silica heterostructures. Paper presented at Optical Interference Coatings, OIC 2013, Canada.