EMI on diagnostics and control circuits due to switching power supplies

E. Gaio, R. Piovan, V. Toigo

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Abstract

This paper deals with the electro magnetic interferences (EMI) induced on diagnostics and control circuits of fusion experiments, due to fast common mode voltages (Vcm) transients. The Vcmcan excite the circulation of noise currents through parasitic capacitances, which couple different parts of the circuit designed to be isolated one to another. Equivalent electric circuits of the phenomena observed in RFX have been derived, which explain the induced noises and have been utilized to identify suitable correction measures; the paper describes these analyses and the experience gained in coping with the reduction of these types of EMI interferences. © 2005 Elsevier B.V. All rights reserved.
Original languageEnglish
Pages (from-to)61 - 66
Number of pages6
JournalFusion Engineering and Design
Volume75-79
Issue numberSUPPL.
DOIs
Publication statusPublished - Nov 2005
Externally publishedYes

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All Science Journal Classification (ASJC) codes

  • Civil and Structural Engineering
  • Materials Science(all)
  • Nuclear Energy and Engineering
  • Mechanical Engineering

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