We report fluorescence imaging of colour centres in Lithium Fluoride (LiF) using an apertureless Scanning Near Field Optical Microscope (SNOM). The sample consists of periodically spaced submicrometric coloured areas F2laser-active colour centres produced by low-energy electron beam lithography on the surface of a LiF thin film. A silicon Atomic Force Microscope (AFM) tip is used as an apertureless optical probe. AFM images show a uniform surface roughness with a RMS of 7.2 nm. The SNOM images of the red fluorescence of colour centres excited at λ = 458 nm with an argon ion laser show that the local photon emission is unambiguously related to the coloured areas and that topographic artefacts can be excluded. © 2001 Optical Society of America.
All Science Journal Classification (ASJC) codes
- Atomic and Molecular Physics, and Optics
Adam, P. M., Benrezzak, S., Bijeon, J. L., Royer, P., Guy, S., Jacquier, B., ... Rigneault, H. (2001). Fluorescence imaging of submicrometric lattices of colour centres in LiF by an apertureless scanning near-field optical microscope. Optics Express, 9(7), 353 - 359. https://doi.org/10.1364/OE.9.000353