Formation process of nanocrystalline materials from x-ray diffraction profile analysis: Application to platinum catalysts

P. Ascarelli, V. Contini, R. Giorgi

Research output: Contribution to journalArticle

38 Citations (Scopus)

Abstract

It's well known that x-ray line profile analysis is a powerful and convenient method to probe the microstructural characteristics of nanocrystalline samples. In the literature well-documented techniques are normally used to obtain crystalline size distributions from x-ray line-broadening analysis. However, it is less considered that the shape of such size distributions may be a means to determine by which mechanism the particles have grown. A simple method is presented here to distinguish between two different growth mechanisms: the coalescence and Ostwald ripening process. An application of the method to platinum nanoparticle electrocatalysts with different size distributions, dispersed on high-surface-area carbon blacks, is discussed. © 2002 American Institute of Physics. © 2002 American Institute of Physics.
Original languageEnglish
Pages (from-to)4556 - 4561
Number of pages6
JournalJournal of Applied Physics
Volume91
Issue number7
DOIs
Publication statusPublished - 1 Apr 2002
Externally publishedYes

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All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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