Growth of Biaxially-Textured La

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Abstract

The growth of oriented buffer layers by chemical solution deposition (CSD) on cube-textured Ni-based substrate is a key point for the development of low-cost YBa2Cu3O7-x(YBCO) coated conductor. Among the suitable compounds, La2Zr2O7(LZO) and CeO2are of particular interest as they enabled an all-chemical route for the fabrication of YBCO coated conductor. It has been recently shown that CSD films can be grown by direct precurson solution deposition on as-rolled, i.e., without cube orientation, metallic substrate. In particular, LZO film with biaxially 001 texture has been successfully grown on either pure copper or Ni-W alloy substrate. In the present contribution, the deposition either LZO or Zr-doped CeO2(CZO) on as-rolled Ni 3.5 at% W (Ni-W) substrate is reported. It is shown that film orientation enhances using low-roughness substrates, with an area fraction of {001} oriented film as high as 96.4% for LZO and 95.4% for CZO. In both cases, the films are well adherent, without blister formation or delamination. Moreover, the film acts as a planarization layer, by smoothing Ni-W intrinsic roughness, also in correspondence of Ni-W grain boundary, where no grooving seems to appear on film surface.
Original languageEnglish
Article number6600905
Pages (from-to)-
JournalIEEE Transactions on Applied Superconductivity
Volume28
Issue number4
DOIs
Publication statusPublished - 1 Jun 2018
Externally publishedYes

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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