Hard x-ray contact microscopy with 250 nm spatial resolution using a LiF film detector and a tabletop microsource

S. Almaviva, F. Bonfigli, I. Franzini, A. Lai, R.M. Montereali, D. Pelliccia, A. Cedola, S. Lagomarsino

Research output: Contribution to journalArticle

44 Citations (Scopus)

Abstract

An innovative route for deep-submicrometer spatial resolution hard x-ray microscopy with tabletop x-ray source is proposed. A film of lithium fluoride (LiF) was used as imaging detector in contact mode. We present here the x-ray images recorded on LiF films of a Fresnel zone plate with submicrometer gold structures and of an onion cataphyll. The images were read with an optical confocal microscope in fluorescence mode. The measured spatial resolution was about 250 nm, i.e., close to the resolution limit of the confocal microscope. The advantages and drawbacks, and the possible improvements, of this route are discussed. © 2006 American Institute of Physics.
Original languageEnglish
Article number054102
Pages (from-to)-
JournalApplied Physics Letters
Volume89
Issue number5
DOIs
Publication statusPublished - 2006
Externally publishedYes

    Fingerprint

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

Cite this

Almaviva, S., Bonfigli, F., Franzini, I., Lai, A., Montereali, R. M., Pelliccia, D., ... Lagomarsino, S. (2006). Hard x-ray contact microscopy with 250 nm spatial resolution using a LiF film detector and a tabletop microsource. Applied Physics Letters, 89(5), -. [054102]. https://doi.org/10.1063/1.2236283