Hemispherical and diffuse reflectance and transmittance of a slightly inhomogeneous film bounded by rough, unparallel interfaces

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Abstract

The optical reflectance and transmittance of an ideal thin film are calculated in a well-known way. As far as a non-ideal thin film is concerned - i.e., a slightly inhomogeneous thin film bounded by rough, unparallel interfaces - three categories of spectral coefficients can be defined, i.e.: specular reflectance and direct transmittance (light intensity flux along the optical axis), hemispherical reflectance and transmittance (light intensity flux integrated over the solid half angle π), and diffuse reflectance and transmittance (light intensity flux scattered around the optical axis) coefficients. In this paper a model recently introduced for the specular and direct coefficients is generalized to calculate also the hemispherical and diffuse coefficients of a non-ideal film. © 2006 Elsevier B.V. All rights reserved.
Original languageEnglish
Pages (from-to)4640 - 4648
Number of pages9
JournalThin Solid Films
Volume515
Issue number11
DOIs
Publication statusPublished - 9 Apr 2007

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

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