High-resolution microscopy with transition from continuous to discrete diffraction

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Abstract

An optical approach aiming at the selection of a finite number of wave vector projections is employed to interpret the diffraction pattern of a microscope useful to probe matter at the nanoscale level. Despite the approximation, we show that accurate three-dimensional analytical description of linear microscopy is still possible and a comparison with the ordinary numerical reconstruction of the focal zone is quantified by tiny relative deviations of about 10-6. The advantageous use of the proposed analytical description is further considered in the vectorial analysis of an example of non-linear microscopy. In any optical regime (either linear or non-linear), the calculation speed increases significantly with respect to the traditional approach based on purely numerical methods. © 2009 Elsevier B.V. All rights reserved.
Original languageEnglish
Pages (from-to)3869 - 3872
Number of pages4
JournalOptics Communications
Volume282
Issue number19
DOIs
Publication statusPublished - 1 Oct 2009

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Physical and Theoretical Chemistry
  • Electrical and Electronic Engineering

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