In this paper, a simple electronic method for the in situ measurement of the multiplier gain 〈g〉 of "open window" electron multipliers is described. The parameter 〈g〉, which is measured for the first time for these devices, is of great relevance because, if the geometrical factor F is known, it allows to determine the total multiplier gain 〈G〉 of the detectors. In its turn, the total multiplier gain 〈G〉, together with the quantum efficiency η, provides a complete absolute calibration of the multiplier. The use of a software multichannel analyzer (MCA), as proposed in this implementation of the calibration method, increases not only the good value, but also the versatility of the technique, rendering it a simple routine procedure. For one multiplier, suitably modified, it has also been possible to measure, in addition to the electron gain 〈g〉, the geometrical factor F and the total multiplier gain 〈G〉 directly. The agreement between these measurements confirms the validity and the interest of the technique adopted to determine 〈g〉. Moreover, the reported tests prove that with a simple modification of the multiplier, which could be simply implemented by the manufacturers, a complete characterization of the geometrical and electrical properties of the device would be possible in a relatively simple way. © 2005 IEEE.
|Pages (from-to)||1227 - 1234|
|Number of pages||8|
|Journal||IEEE Transactions on Instrumentation and Measurement|
|Publication status||Published - Jun 2005|
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering
Murari, A., Lotto, L., Costa, S., & Molon, I. (2005). In situ measurement of "open window" electron multipliers' gain. IEEE Transactions on Instrumentation and Measurement, 54(3), 1227 - 1234. https://doi.org/10.1109/TIM.2005.847204