The microstructure of Ni-5at%W (Ni-W) and Ni-11at%V (Ni-V) biaxially textured substrates has been investigated using X-ray Diffraction (XRD) and Electron Backscatter Diffraction (EBSD). The correlation between the substrate microstructure and superconducting transport properties of YBa2Cu3O7-y, (YBCO) film grown on it has been studied on the YBCO/CeO2/Ni-W and YBCO/CeO2/NiO/Ni-V architectures. Our study has ascertained that the in-plane texture of the substrates is one of the most important factors, limiting the critical current density. The Ni-V substrate has a lower percolation area due to the larger number of twinned grains and a broader in-plane angular distribution and, as a consequence, the YBa2Cu3O7-y(YBCO) film grown on it has a critical current density of 0.6 × 106A/cm2, depressed by factor 2 with respect to YBCO grown on the Ni-W substrate. For the Ni-V substrate, another limiting factor is its low oxidation resistance. In contrast to Ni-V, the Ni-W substrate has a larger percolation area, mainly due to the absence of twinned grains, and a high oxidation resistance.
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering
- Physics and Astronomy (miscellaneous)
Celentano, G., Varesi, E., Petrisor, T., Boffa, V., Ciontea, L., Galluzzi, V., ... Vannozzi, A. (2003). Influence of the substrate microstructure on the superconducting properties of YBCO coated conductors. IEEE Transactions on Applied Superconductivity, 13(2 III), 2591 - 2594. https://doi.org/10.1109/TASC.2003.811856