Low energy electron irradiation of lithium fluoride (LiF), in the form of bulk crystals and films, gives rise to the stable formation of primary and aggregated colour centres in a thin layer located at the surface of the investigated material. A confocal light scanning microscope in fluorescence mode was used to reconstruct the depth distribution of visible emitting aggregate defects in narrow stripe-like coloured regions induced by electron beam lithography on LiF films thermally evaporated on glass. The formation of the F3+and F2aggregate defects appears restricted to the electron penetration and proportional to their energy depth profile, as obtained from Monte Carlo simulations. The influence of the polycrystalline nature of the investigated structure is briefly discussed.
|Pages (from-to)||135 - 139|
|Number of pages||5|
|Journal||Radiation Effects and Defects in Solids|
|Publication status||Published - 2002|
All Science Journal Classification (ASJC) codes
- Nuclear and High Energy Physics
- Materials Science(all)
- Condensed Matter Physics
Montereali, R. M., Bigotta, S., Giammatteo, M., Piccinini, M., Picozzi, P., & Santucci, S. (2002). Investigation of visible laser active colour centres in LiF films by confocal fluorescence microscopy. Radiation Effects and Defects in Solids, 156(1), 135 - 139.