Lithium diffusion in cerium-vanadium mixed oxide thin films: A systematic study

F. Varsano, F. Decker, E. Masetti, F. Croce

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Abstract

Three electroanalytical techniques have been used to study the solid-state ionic diffusion of lithium into cerium-vanadium mixed oxide thin films, i.e. potentiostatic intermittent titration technique, galvanostatic intermittent titration technique and electrochemical impedance spectroscopy. Diffusion coefficients measured with the above mentioned techniques show a non-monotonic decay between 8 × 10-12 and 8 × 10-14 cm2s-1. In particular, lithium diffusion coefficient drops by more than one order of magnitude at lithium intercalation degree x = 0.6. This abrupt change seems to be related to a dramatic increase of the material resistance suggesting that the limiting factor in atomic lithium diffusion may be the low electronic conductivity. © 2001 Elsevier Science Ltd.
Original languageEnglish
Pages (from-to)2069 - 2075
Number of pages7
JournalElectrochimica Acta
Volume46
Issue number13-14
DOIs
Publication statusPublished - 2 Apr 2001
Externally publishedYes

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All Science Journal Classification (ASJC) codes

  • Chemical Engineering(all)
  • Electrochemistry

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