By using a dynamical model giving both the IR reflectivity and transmittivity of a semiconductor after an intense photo-plasma production, it is possible to derive several electrical parameters, as Auger recombination, radiative recombination and impurity recombination. The model has been tested on previous experimental works and used to analyse the 10.6 μm dynamical transmission reflection induced by a 1.06 ns excitation in Ge optical windows.
All Science Journal Classification (ASJC) codes
- Atomic and Molecular Physics, and Optics
- Mathematical Physics
- Condensed Matter Physics
Marchetti, S., Martinelli, M., Simili, R., Giorgi, M., & Fantoni, R. (2001). Measurement of Ge electrical parameters by analysing its optical dynamics. Physica Scripta, 64(5), 509 - 511. https://doi.org/10.1238/Physica.Regular.064a00509