Measurement of optical constants of thin films by non conventional ellipsometry, photothermal deflection spectroscopy and plasmon resonance spectroscopy

Anna Krasilnikova Sytchkova

Research output: Contribution to conferencePaper

2 Citations (Scopus)


An overview of methods for experimental determination of thin film optical constants is given, with an emphasis on recent advances in non conventional optical techniques. The generalized ellipsometry, the photothermal deflection spectroscopy (PDS) and the surface plasmon resonance (SPR) spectroscopy are more sophisticated and versatile tools, compared to traditional spectrophotometry and ellipsometry. The generalised ellipsometry in terms of Jones or Mueller matrix coefficients provides a more detailed model of the layered structure: material anisotropy, layer roughness, etc. The PDS may yield the accuracy of the direct absorption measurement unavailable with other approaches. The SPR phenomenon may be used for characterisation of ultra thin films, even having a complex spatial distribution, as well as to retrieve information on the refractive index depth distribution in the near-to-surface film zone. The advantages and drawbacks of these methods of thin film optical constants characterization are discussed. The complementary nature of various measurements allows deeper understanding of layered structures formation by non destructive optical methods. The examples of application of these techniques for characterization of single films and multilayers are given. © 2008 SPIE.
Original languageEnglish
Publication statusPublished - 2008
Externally publishedYes
EventAdvances in Optical Thin Films III - , United Kingdom
Duration: 1 Jan 2008 → …


ConferenceAdvances in Optical Thin Films III
CountryUnited Kingdom
Period1/1/08 → …


All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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