Ohmic ion temperature and thermal diffusivity profiles from the JET neutron emission profile monitor

B. Esposito, F.B. Marcus, J.M. Adams, S. Conroy, O.N. Jarvis, M.J. Loughlin, G. Sadler, P. Van Belle, N. Watkins

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Abstract

The JET neutron emission profile monitor was used to study ohmically heated deuterium discharges. The radial profile of the neutron emissivity is deduced from the line-integral data. The profiles of ion temperature, Ti, and ion thermal diffusivity, chii, are derived under steady-state conditions. The inferred chii, for 0.3 < p = r/a < 0.5, is in the range 0.5-2.5m2s-1. The ion thermal diffusivity is higher than, and its scaling with plasma current opposite to, that predicted by neoclassical theory.
Original languageEnglish
Article number006
Pages (from-to)1433 - 1440
Number of pages8
JournalPlasma Physics and Controlled Fusion
Volume35
Issue number10
DOIs
Publication statusPublished - 1993
Externally publishedYes

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All Science Journal Classification (ASJC) codes

  • Nuclear Energy and Engineering
  • Condensed Matter Physics

Cite this

Esposito, B., Marcus, F. B., Adams, J. M., Conroy, S., Jarvis, O. N., Loughlin, M. J., ... Watkins, N. (1993). Ohmic ion temperature and thermal diffusivity profiles from the JET neutron emission profile monitor. Plasma Physics and Controlled Fusion, 35(10), 1433 - 1440. [006]. https://doi.org/10.1088/0741-3335/35/10/006