The use of LiF thin films and single crystals was proposed and tested as X-ray imaging detector based on optically stimulated luminescence from visible-emitting color centers. The main peculiarities of this detector - i.e. high spatial resolution on a large field of view, wide dynamic range, versatility and simplicity of use - make it very promising as X-ray imaging plate for applications in photonic devices, biology and material science, as well as in the characterization of intense X-ray sources. In order to investigate the response and the sensitivity of this detector to soft X-rays, a suitable characterization of colored thin layers is performed by means of optical spectrophotometry and photoluminescence spectroscopy for samples colored under different irradiation conditions. © 2009 Elsevier B.V. All rights reserved.
All Science Journal Classification (ASJC) codes
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics
Bonfigli, F., Flora, F., Franzini, I., Nichelatti, E., & Montereali, R. M. (2009). Optical characterization of a soft X-ray imaging detector based on photoluminescent point defects in lithium fluoride thin layers. Journal of Luminescence, 129(12), 1964 - 1967. https://doi.org/10.1016/j.jlumin.2009.04.035