Optical characterization of a soft X-ray imaging detector based on photoluminescent point defects in lithium fluoride thin layers

F. Bonfigli, F. Flora, I. Franzini, E. Nichelatti, R.M. Montereali

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6 Citations (Scopus)

Abstract

The use of LiF thin films and single crystals was proposed and tested as X-ray imaging detector based on optically stimulated luminescence from visible-emitting color centers. The main peculiarities of this detector - i.e. high spatial resolution on a large field of view, wide dynamic range, versatility and simplicity of use - make it very promising as X-ray imaging plate for applications in photonic devices, biology and material science, as well as in the characterization of intense X-ray sources. In order to investigate the response and the sensitivity of this detector to soft X-rays, a suitable characterization of colored thin layers is performed by means of optical spectrophotometry and photoluminescence spectroscopy for samples colored under different irradiation conditions. © 2009 Elsevier B.V. All rights reserved.
Original languageEnglish
Pages (from-to)1964 - 1967
Number of pages4
JournalJournal of Luminescence
Volume129
Issue number12
DOIs
Publication statusPublished - Dec 2009
Externally publishedYes

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All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Chemistry(all)
  • Biochemistry
  • Biophysics

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