Optical parameters of oxide films typically used in optical coating production

Alexander V. Tikhonravov, Michael K. Trubetskov, Tatiana V. Amotchkina, Gary DeBell, Vladimir Pervak, Anna Krasilnikova Sytchkova, Maria Luisa Grilli, Detlev Ristau

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Abstract

Wavelength dependencies of refractive indices of thin film materials differ for various deposition conditions, and it is practically impossible to attribute a single refractive index wavelength dependence to any typical thin film material. Besides objective reasons, differences in the optical parameters of thin films may also be connected with nonadequate choices of models and algorithms used for the processing of measurement data. The main goal of this paper is to present reliable wavelength dependencies of refractive indices of the most widely used slightly absorbing oxide thin film materials. These dependencies can be used by other researchers for comparison and verification of their own characterization results. © 2010 Optical Society of America.
Original languageEnglish
Pages (from-to)-
JournalApplied Optics
Volume50
Issue number9
DOIs
Publication statusPublished - 20 Mar 2011

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All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics
  • Engineering (miscellaneous)

Cite this

Tikhonravov, A. V., Trubetskov, M. K., Amotchkina, T. V., DeBell, G., Pervak, V., Sytchkova, A. K., Grilli, M. L., & Ristau, D. (2011). Optical parameters of oxide films typically used in optical coating production. Applied Optics, 50(9), -. https://doi.org/10.1364/AO.50.000C75