Oxidation behavior at the Ni-W and CeO2 interface with and without Pd over layer

A. Mancini, A. Vannozzi, V. Galluzzi, A. Rufoloni, A. Augieri, A. Angrisani Armenio, I. Colantoni, I. Davoli, G. Celentano

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Abstract

The interface between the cube textured Ni-W substrate, both bare and Pd-buffered, and the CeO2YSZ buffer layer structure-required to growth YBCO coated conductors- samples have been subjected to different oxidizing conditions and have been investigated with different techniques: X-ray diffraction (XRD), X-ray absorption and Auger electron spectroscopy. Due to the Ni-Pd interdiffusion, the presence of a Pd over layer significantly modifies the substrate surface composition and the substrate oxidation mechanism. Depending on the Pd layer thickness, the formation of NiO can be completely prevented while the formation of ternary oxides and of W oxide is favored. Moreover, the Pd layer affects the extension of interface between the substrate and the CeO2layer and the portion of uncontaminated CeO2. © 2010 IEEE.
Original languageEnglish
Article number5634091
Pages (from-to)2891 - 2895
Number of pages5
JournalIEEE Transactions on Applied Superconductivity
Volume21
Issue number3 PART 3
DOIs
Publication statusPublished - Jun 2011
Externally publishedYes

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All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Condensed Matter Physics
  • Electronic, Optical and Magnetic Materials

Cite this

Mancini, A., Vannozzi, A., Galluzzi, V., Rufoloni, A., Augieri, A., Angrisani Armenio, A., ... Celentano, G. (2011). Oxidation behavior at the Ni-W and CeO2 interface with and without Pd over layer. IEEE Transactions on Applied Superconductivity, 21(3 PART 3), 2891 - 2895. [5634091]. https://doi.org/10.1109/TASC.2010.2083613