Properties of biaxially oriented Y

F. Fabbri, C. Annino, V. Boffa, G. Celentano, L. Ciontea, U. Gambardella, G. Grimaldi, A. Mancini, T. Petrisor

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Abstract

A study regarding the epitaxial growth of Y2O3-based buffer layer architectures on (001)[100] textured Ni-V metallic substrates using both PLD and e-beam evaporation is presented. The as deposited films exhibit good structural and morphological properties indicating that the Y2O3is a suitable layer for epitaxial growth of YBCO superconducting films for power applications. Mainly, YBCO/CeO2/Y2O3/Ni-V and YBCO/CeO2/Y2O3/NiO/Ni-V architectures have been studied.
Original languageEnglish
Pages (from-to)2503 - 2504
Number of pages2
JournalPhysica C: Superconductivity and its Applications
Volume341-348 (IV)
DOIs
Publication statusPublished - 2000
Externally publishedYes

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

Cite this

Fabbri, F., Annino, C., Boffa, V., Celentano, G., Ciontea, L., Gambardella, U., ... Petrisor, T. (2000). Properties of biaxially oriented Y. Physica C: Superconductivity and its Applications, 341-348 (IV), 2503 - 2504. https://doi.org/10.1016/S0921-4534(00)01295-8