Properties of MgB

A. Mancini, V. Galluzzi, U. Besi Vetrella, V. Boffa, G. Celentano, L. Ciontea, U. Gambardella, G. Grassano, T. Petrisor, A. Rufoloni, S. Sprio, M. Vadrucci

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Abstract

The formation and characterization of MgB2thin films is explored, using room-temperature deposition of precursor layers and subsequent annealing in-situ. Precursors were deposited by means of pulsed laser deposition (PLD), electron beam (EB), and sputtering (SD) techniques. Best results were obtained for B/Mg multilayers deposited by EB and annealed at 630 °C for 10 minutes, snowing typical TConand TC0values of about 32-34 K and 31-32 K, respectively. Structural and morphological analyses were performed by x-ray diffraction and SEM. A comparison among the different growth techniques is presented. Results are explained taking into account the pressure-temperature phase diagram of the Mg-B system.
Original languageEnglish
Pages (from-to)3305 - 3308
Number of pages4
JournalIEEE Transactions on Applied Superconductivity
Volume13
Issue number2 III
DOIs
Publication statusPublished - 2003
Externally publishedYes

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Cite this

Mancini, A., Galluzzi, V., Vetrella, U. B., Boffa, V., Celentano, G., Ciontea, L., ... Vadrucci, M. (2003). Properties of MgB. IEEE Transactions on Applied Superconductivity, 13(2 III), 3305 - 3308. https://doi.org/10.1109/TASC.2003.812297