Role of oxygen contaminant on the physical properties of sputtered AlN thin films

M.A. Signore, A. Taurino, D. Valerini, A. Rizzo, I. Farella, M. Catalano, F. Quaranta, P. Siciliano

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7 Citations (Scopus)


The paper deals with the role of the oxygen contamination, coming from residual gas atmosphere in the deposition chamber, on the physical properties of AlN thin films, sputtered in Ar + N2 working gas, at different values of nitrogen flux percentages, and without substrate heating. Contaminant concentration varies with the nitrogen partial pressure in the working gas mixture. Oxygen atoms are incorporated into the growing films due to their higher affinity towards Al atoms compared to N atoms. Oxygen inclusion produces important modifications in the structural, chemical, optical and electrical properties of the AlN thin films. Therefore, contamination can play a crucial role for the tuning of the physical characteristics of sputtered materials.
Original languageEnglish
Pages (from-to)1267 - 1272
Number of pages6
JournalJournal of Alloys and Compounds
Publication statusPublished - 18 Aug 2015
Externally publishedYes


All Science Journal Classification (ASJC) codes

  • Mechanics of Materials
  • Mechanical Engineering
  • Metals and Alloys
  • Materials Chemistry

Cite this

Signore, M. A., Taurino, A., Valerini, D., Rizzo, A., Farella, I., Catalano, M., Quaranta, F., & Siciliano, P. (2015). Role of oxygen contaminant on the physical properties of sputtered AlN thin films. Journal of Alloys and Compounds, 649, 1267 - 1272.