Scanning electron microscopy of thin specimens using secondary electrons produced by the conversion of transmitted electrons

P.G. Merli, A. Migliori, M. Nacucchi, M. Vittori Antisari, D. Govoni

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)142 - 143
Number of pages2
JournalScanning
Volume18
Issue number3
Publication statusPublished - 1996
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics
  • Instrumentation

Cite this

Merli, P. G., Migliori, A., Nacucchi, M., Vittori Antisari, M., & Govoni, D. (1996). Scanning electron microscopy of thin specimens using secondary electrons produced by the conversion of transmitted electrons. Scanning, 18(3), 142 - 143.