Sensitivity of reliability-growth models to operational profile errors vs testing accuracy

A. Pasquini, A.N. Crespo, P. Matrella

Research output: Contribution to journalArticle

55 Citations (Scopus)

Abstract

Summary & Conclusions -This paper investigates: 1) the sensitivity of reliability-growth models to errors in the estimate of the operational profile (OP), and 2) the relation between this sensitivity and the testing accuracy. The investigation is based on the results of a case study in which several reliability-growth models are applied during the testing phase of a software system. The faults contained in the system are known in advance; this allows measurement of the software reliability-growth and comparison with the estimates provided by the models. Measurement & comparison are repeated for various OP, thus giving information about the effect of a possible error in the estimate of the OP. The results show that: 1) the predictive accuracy of the models is not heavily affected by errors in the estimate of the OP, and 2) this relation depends on the accuracy with which the software system has been tested. ©1996 IEEE.
Original languageEnglish
Pages (from-to)531 - 540
Number of pages10
JournalIEEE Transactions on Reliability
Volume45
Issue number4
DOIs
Publication statusPublished - 1996

    Fingerprint

All Science Journal Classification (ASJC) codes

  • Safety, Risk, Reliability and Quality
  • Electrical and Electronic Engineering

Cite this