Simulation of space charge compensation in a multibeamlet negative ion beam

E. Sartori, T.J. MacEina, P. Veltri, M. Cavenago, G. Serianni

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Abstract

Ion beam space charge compensation occurs by cumulating in the beam potential well charges having opposite polarity, usually generated by collisional processes. In this paper we investigate the case of a H-ion beam drift, in a bi-dimensional approximation of the NIO1 (Negative Ion Optimization phase 1) negative ion source. H-beam ion transport and plasma formation are studied via particle-in-cell simulations. Differential cross sections are sampled to determine the velocity distribution of secondary particles generated by ionization of the residual gas (electrons and slow H2+ions) or by stripping of the beam ions (electrons, H, and H+). The simulations include three beamlets of a horizontal section, so that multibeamlet space charge and secondary particle diffusion between separate generation regions are considered, and include a repeller grid biased at various potentials. Results show that after the beam space charge is effectively screened by the secondary plasma in about 3 μs (in agreement with theoretical expectations), a plasma grows across the beamlets with a characteristic time three times longer, and a slight overcompensation of the electric potential is verified as expected in the case of negative ions.
Original languageEnglish
Article number02B917
Pages (from-to)-
JournalReview of Scientific Instruments
Volume87
Issue number2
DOIs
Publication statusPublished - 1 Feb 2016
Externally publishedYes

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All Science Journal Classification (ASJC) codes

  • Instrumentation

Cite this

Sartori, E., MacEina, T. J., Veltri, P., Cavenago, M., & Serianni, G. (2016). Simulation of space charge compensation in a multibeamlet negative ion beam. Review of Scientific Instruments, 87(2), -. [02B917]. https://doi.org/10.1063/1.4933252