In this work, we investigate the optical and the structural properties of Ag films by means of spectrophotometric techniques and X-ray diffraction methods in the low- and high-angle regimes. The coatings were grown by radio frequency magnetron sputtering on (100)-oriented silicon substrates. Several sets of samples were produced by varying the sputtering pressure (0.15-0.9 Pa) and changing the sputtering power supply in the range of 25-100 W. In particular, the dependence of the coating optical features, surface roughness, texture and residual stress on the parameter β, proportional to the momentum transferred to the growing film from the energetic particles bombarding it, was pointed out. The results indicate that the Ag films are polycrystalline with a moderate  texture and compressive in-plane stress was measured for all the investigated samples. The behavior of the stress with the momentum parameter can be summarized as follows: (i) the compressive stress increases in the range 01000 V2s/Å. © 2001 Elsevier Science B.V. All rights reserved.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Metals and Alloys
- Materials Chemistry
Rizzo, A., Tagliente, M. A., Alvisi, M., & Scaglione, S. (2001). Structural and optical properties of silver thin films deposited by RF magnetron sputtering. Thin Solid Films, 396(1-2), 29 - 35. https://doi.org/10.1016/S0040-6090(01)01242-1