Structural properties and photoluminescence spectra of coloured LiF films on SiO

L. Fornarini, A. Mancini, S. Martelli, R.M. Montereali, P. Picozzi, S. Santucci

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Abstract

Lithium fluoride films, about 2.6 μm of thickness, were thermally evaporated onto a 10 μm thick SiO2film grown on silicon 〈1 0 0〉 substrate. Coloured stripes in the LiF films were created by low energy electron (12 keV) beam lithography. Intense photoluminescence (PL), extending from green to red in the visible spectral range, was measured at room temperature due to the presence of the laser active F2and F3+colour centres. Atomic force microscopy (AFM) analysis was used to study the film morphology inside and outside the irradiated areas. A confocal microscope was used to observe the surface layer of the film.
Original languageEnglish
Pages (from-to)141 - 145
Number of pages5
JournalJournal of Non-Crystalline Solids
Volume245
Issue number1-3
DOIs
Publication statusPublished - 1 Apr 1999
Externally publishedYes

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Condensed Matter Physics
  • Materials Chemistry

Cite this

Fornarini, L., Mancini, A., Martelli, S., Montereali, R. M., Picozzi, P., & Santucci, S. (1999). Structural properties and photoluminescence spectra of coloured LiF films on SiO. Journal of Non-Crystalline Solids, 245(1-3), 141 - 145. https://doi.org/10.1016/S0022-3093(98)00880-1